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Showing results: 2251 - 2265 of 2704 items found.

  • Dual Temperature

    Fieldpiece Instruments, Inc

    The Fieldpiece Dual-Temperature Accessory, model ATH4, measures two temperatures simultaneously using the included k-type, wrap tab beaded thermocouples. The technology inside the ATH4 provides superior temperature compensation in rapidly changing environments commonly found while performing field service. Use the ATH4 to find Delta T and just about any temperature split you want to measure. Displays T1, T2 and T1-T2 on your Fieldpiece meter, handle or data logger. It is included with the HVAC Guide® System Analyzer to get target superheat and for the Target Evaporator Exit Temperature test. Fieldpiece offers a wide variety of k-type thermocouples for various HVAC specific applications. Use pipe clamp T/Cs with the ATH4 to check for blocked filters.

  • Squeak And Rattle Test Solutions

    MB Dynamics Inc.

    sandrAnnoying noises like squeaks and rattles have become a significant quality issue for customers of passenger vehicles, light & heavy commercial vehicles, increasingly off-road vehicles, and even airplane applications. These unwanted sounds are a problem for numerous reasons including customer dissatisfaction, sizeable warranty expense, and the overlying difficulty to diagnose and fix. MB Dynamics offers an innovative line of Buzz, Squeak & Rattle (BSR) or Squeak and Rattle (S&R) Test Solutions, focused on helping to eliminate annoying noises through prevention, design verification testing, and production verification testing, before the product reaches the customer.

  • Portable JTAG Boundary-Scan Controller with USB (1.1 and 2.0 High Speed), Ethernet & Firewire Interfaces

    JT 37x7/TSI - JTAG Technologies Inc.

    High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.

  • PXIe-7821, Kintex 7 160T FPGA, 128 DIO, 512 MB DRAM, PXI Digital Reconfigurable I/O Module

    783485-01 - NI

    Kintex 7 160T FPGA, 128 DIO, 512 MB DRAM, PXI Digital Reconfigurable I/O Module—The PXIe‑7821 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7821 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7821 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in-‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.

  • PXIe-7820, Kintex 7 160T FPGA, 128 DIO, PXI Digital Reconfigurable I/O Module

    783484-01 - NI

    Kintex 7 160T FPGA, 128 DIO, PXI Digital Reconfigurable I/O Module—The PXIe‑7820 is a reconfigurable I/O (RIO) device that features a user-programmable FPGA for onboard processing and flexible I/O operation. With LabVIEW FPGA, you can individually configure the digital lines as inputs, outputs, counter/timers, PWM, encoder inputs, or specialized communication protocols. You can also program custom onboard decision making that executes with hardware-timed speed and reliability. Each line offers software-selectable logic levels. The PXIe‑7820 supports peer‑to‑peer streaming for direct data transfer between PXI Express modules. The PXIe‑7820 is well-suited for a wide variety of applications, such as high-speed waveform generation, sensor simulation, hardware‑in‑the‑loop (HIL) test, bit error rate test, and other applications that require precise timing and control.

  • Pulse Pattern Generator, 3.35 GHz, single channel

    81133A - Keysight Technologies

    The Keysight 81133A single-channel 3.35 GHz Pulse Pattern Generator is the latest product in the long history of Keysights high-speed Pulse Pattern Generators. When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. Like its predecessor, the Keysight 8133A, the new 81133A sets the standard for high-speed applications. The Keysight 81133A lets you test your DUT instead of the pulse or data source! For applications that require multiple output channels or multi-level signaling like pre- and de-emphasis (PCI Express) or squelch (Serial ATA), please refer to the 81134A.

  • AC Power Sources

    i-iX Series II - AMETEK Programmable Power, Inc.

    The iX Series II represents a new generation of AC and DC power source that addresses increasing demands on test equipment to perform more functions at a lower cost. By combining a flexible AC/DC power source with a high performance power analyzer, the iX Series II systems are capable of handling complex applications that have traditionally required multiple instruments.

  • Walk-in and Drive-in Chambers

    ESPEC North America, INC.

    Standard and custom walk-in rooms deliver the temperature and/or humidity testing performance you need. Our Panelized Walk-ins are modular and flexible in design and installation. We also specialize in Solid one-piece construction chambers for extreme environmental conditions.For larger test samples (example: full vehicle) ESPEC's Drive-in systems deliver performance needed for automotive applications.

  • CCD Spectroradiometer

    LMS-8000A/LMS-8000 - Lisun Electronics Inc.

    LMS-8000A/LMS-8000 LED Measurement System is an automated measurement system for identifying the performance of individual LED. It is designed to have a capability of producing any visible spectral distribution, mimicking various light sources in the visible region by feedback control of the radiant power emitted by individual LEDs. This LED test system will be used as a transfer standard for photometric, colorimetric and radiometric applications.

  • Radio Frequency (RF) And Microwave Products

    Microchip Technology Inc.

    Enable your 5G, aerospace, defense, test and measurement or industrial RF wireless applications with our portfolio of RF and microwave devices. These include high reliability RF diodes, Gallium Nitride (GaN) and Gallium Arsenide (GaAs) Monolithic Microwave Integrated Circuit (MMIC) amplifiers, frequency translation and power transistor devices, switches, attenuators, varactors, filters and more.

  • Environmental Chambers

    Iwasaki Electric Co., Ltd.

    Whatever your application, from an environmental chamber for small components to an extensive array for a complete automobile or aircraft test, EYE / Iwasaki has the experience to provide a solar lighting system customized for your requirements. Our systems are designed to be flexible and deliver the optimum solar simulation solution. We do not force-fit a "standard" system to attempt to meet your needs.

  • Engineering Services

    Analysis, Integration & Design, Inc.

    Simulation SystemsAutomatic Test Systems (ATS)Data Acquisition & Control SystemsCommunications SystemsAIDI provides complete system development, produces software applications, facilitates integration, and provides deployment support. We integrate with customer needs and requirements to provide entire solutions or work within existing processes to reinforce teams and efforts already underway. We listen and deliver.

  • Circuit Breaker Contact Resistance Meters

    Vanguard Instruments Company, Inc.

    The Vanguard Auto-Ohm 10 is a 10-ampere battery powered micro-ohmmeter designed for low-resistance-measuring applications such as the measurement of resistance in circuit breaker contacts, bushing contact joints, and welding joints. The unit is powered by four 3400mAh, 3.7Vdc Li-Ion rechargeable batteries. With these high capacity batteries, up to 2,900 tests per charge (10A/2 second duration) can be performed in the field.

  • RF Switch Matrices

    Teledyne Defense Electronics

    For applications involving the test and measurement of multiple RF components, Teledyne Coax offers Custom Switch Matrix solutions to integrate multiple switches, along with additional components including filters, mixers, and attenuators, as required. These Custom Switch Matrix units can contain SPDT, Transfer, or Multi-Throw Switches in either Multiple Input Multiple Output (MIMO) or Multiplexer (MUX) configurations.

  • High-Density PXI Switch Matrix Modules

    Pickering Interfaces Ltd.

    Pickering's range of high-density switch matrix modules is a cost-effective solution for applications that require high-density matrices in the PXI format. The ability to expand to larger matrices is possible by connecting together multiple modules. Reed relay versions use high quality sputtered ruthenium reeds that exhibit excellent contact performance under low and medium level switching conditions, solid-state relay versions available for high speed and long life and electro-mechanical versions for current handling up to 2 Amps. Select models are supported by Pickering's Diagnostic Test Tools, Built-In-Relay-Self-Test (BIRST) and eBIRST Switching System Test Tools, these tools provide a quick and simple way of finding relay failures within LXI, PCI and PXI switch systems.

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